Lorena ANGHEL
France
Cell-Aware Defect Oriented Testing Methodologies for Multi-Level Magnetic Memories
Multipillar spintronic memory has emerged as a strong candidate for next-generation magnetoresistive random access memory (MRAM), offering key advantages such as low power consumption, high integration density, and compatibility with in-memory and neuromorphic computing architectures. However, the increased fabrication complexity of multipillar structures makes them inherently more susceptible to manufacturing defects, calling for advanced and scalable test methodologies.
In this context, a cell-aware test strategy should be positioned as a key enabler, allowing defect-oriented modeling at the device level and a more accurate representation of process-induced variations. Such an approach must be supported by dedicated fault models and tailored test algorithms to ensure comprehensive defect detection. Furthermore, the adoption of a multilevel sensing scheme enables the concurrent testing of multiple magnetic tunnel junctions (MTJs) within a device, significantly reducing overall test time while preserving high fault coverage.
Biography
Lorena Anghel is a Full Professor at Grenoble Institute of Engineering and Management (INPG) in Microelectronics and Embedded Systems Engineering and a member of the research staff of the SPINTEC Laboratory. Her research interests include design and validation of reliable digital integrated circuits, fault-tolerant hardware/software design, aging-induced reliability issues, defects and variation tolerance for emerging technologies, with a particular focus on the design of logic and memory circuits based on magnetic components. Between 2019-2024, she held an Excellence Chair position at the AI Multi-Disciplinary Institute in Grenoble on the topic of “Non-Volatile Emerging Based Spiking Neural Network”. She has been involved in several European projects and French national funding agency projects. Dr. Anghel has served on numerous technical program committees of conferences and symposia. She was also General Chair and Program Chair of several IEEE test- and reliability-related conferences and symposia, including DATE, ETS, VTS, IOLTS, and others. Dr. Anghel has been the recipient of 5 Best Paper Awards and one Outstanding Paper Award. She has published more than 200 works in peer-reviewed international conferences and journals. Dr. Anghel has supervised 28 PhD students, 4 post-docs and more than 30 master's and engineering students. From 2016 to 2020, Dr. Anghel was Deputy Vice President at Grenoble INP, in charge of Industrial Relationships, from 2020-2024 Scientific Director of Grenoble INP covering Micro and Nanoelectronic Technology and Design, Computer Science and Electrical Engineering, and from 2024-2025 she was Vice-President of Grenoble INP for Research and Scientific Council.